{"product_id":"field-emission-scanning-electron-microscopy-new-perspectives-for-mater-9789811044328","title":"Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization","description":"\u003cp\u003e\u003cstrong\u003eAuthor:\u003c\/strong\u003e Nicolas Brodusch, Hendrix Demers, Raynald Gauvin\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003ePublisher:\u003c\/strong\u003e Springer Nature Singapore\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eYear:\u003c\/strong\u003e 2017\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eISBN:\u003c\/strong\u003e 9789811044328\u003c\/p\u003e","brand":"Springer Nature Singapore","offers":[{"title":"Default Title","offer_id":67603786498201,"sku":"9789811044328","price":7990.0,"currency_code":"PKR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0735\/5642\/6905\/files\/view_archive_964fd640-d622-49e0-8506-60fb4cbc40f5.jpg?v=1790942662","url":"https:\/\/booksworldstore.com\/products\/field-emission-scanning-electron-microscopy-new-perspectives-for-mater-9789811044328","provider":"Books World","version":"1.0","type":"link"}