{"product_id":"risk-methodologies-for-technological-legacies-9781402012587","title":"Risk Methodologies for Technological Legacies","description":"\u003cp\u003e\u003cstrong\u003eAuthor:\u003c\/strong\u003e Dennis Bley, Vitaly A. Eremenko\u003cbr\u003e\u003cstrong\u003ePublisher:\u003c\/strong\u003e Springer Science \u0026amp; Business Media\u003cbr\u003e\u003cstrong\u003eEdition Year:\u003c\/strong\u003e 2003\u003cbr\u003e\u003cstrong\u003eISBN:\u003c\/strong\u003e 9781402012587\u003c\/p\u003e","brand":"Springer Science \u0026 Business Media","offers":[{"title":"Default Title","offer_id":67610297303193,"sku":"9781402012587","price":7990.0,"currency_code":"PKR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0735\/5642\/6905\/files\/view_archive_56b48b72-77a3-4ce5-afab-27e9f3e26ed2.jpg?v=1791100098","url":"https:\/\/booksworldstore.com\/products\/risk-methodologies-for-technological-legacies-9781402012587","provider":"Books World","version":"1.0","type":"link"}