• Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization
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Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization

Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization

Rs.7,990.00 PKR
Rs.7,990.00 PKR
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Author: Nicolas Brodusch, Hendrix Demers, Raynald Gauvin

Publisher: Springer Nature Singapore

Year: 2017

ISBN: 9789811044328

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Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization
Field Emission Scanning Electron Microscopy New Perspectives for Materials Characterization Rs.7,990.00